Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.

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TextPublication details: West Conshohocken, PA : ASTM, c1998.Description: 392 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Barcode
Books	Central Library, KUET General Stacks	621.38152 REC (Browse shelf(Opens below))	1	Available	3010032500

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Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.

"STP 1340."

Includes bibliographical references and indexes.

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