introduction to microscopic and spectroscopic methods Leng, Y. (Yang) creator author. text bibliography Electronic books. gw Germany Wiley-VCH c2013 2013 2nd ed. monographic eng 1 online resource (xiv, 376 pages) : ill. ; 25 cm. Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solutions manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy). Light Microscopy -- X-Ray Diffraction Methods -- Transmission Electron Microscopy -- Scanning Electron Microscopy -- Scanning Probe Microscopy -- X-Ray Spectroscopy for Elemental Analysis -- Electron Spectroscopy for Surface Analysis -- Secondary Ion Mass Spectrometry for Surface Analysis -- Vibrational Spectroscopy for Molecular Analysis -- Thermal Analysis. Yang Leng. Includes bibliographical references and index. Text in English. Materials Materials Analysis Electron microscopy Materials Analysis TECHNOLOGY & ENGINEERING Engineering (General) TECHNOLOGY & ENGINEERING Reference Materials Materials Analysis Werkstoffprüfung Mikrostruktur Mikroskopie Spektroskopie Thermoanalyse 620.11 Leng, Y. (Yang). Weinheim : Wiley-VCH, 2013 2nd edition. (OCoLC)853507435 9783527334636 (HB) http://onlinelibrary.wiley.com/book/10.1002/9783527670772 http://onlinelibrary.wiley.com/book/10.1002/9783527670772 EBLCP 250114 20250114101316.0 ocn855504094 eng