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  <titleInfo>
    <title>Model-based testing for embedded systems</title>
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  <name type="personal">
    <namePart>Zander, Justyna.</namePart>
  </name>
  <name type="personal">
    <namePart>Schieferdecker, Ina.</namePart>
  </name>
  <name type="personal">
    <namePart>Mosterman, Pieter J.</namePart>
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    <place>
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    <publisher>CRC Press</publisher>
    <dateIssued>2011</dateIssued>
    <issuance>monographic</issuance>
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    <extent>xxvii, 660 p. : ill., ports.</extent>
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  <tableOfContents>part 1. Introduction -- pt. 2. Automatic test generation -- pt. 3. Integration and multilevel testing -- pt. 4. Specific approaches -- pt. 5. Testing in industry -- pt. 6. Testing at the lower levels of development.</tableOfContents>
  <note type="statement of responsibility">edited by Justyna Zander, Ina Schieferdecker, and Pieter J. Mosterman.</note>
  <note>Includes bibliographical references and index.</note>
  <note>Also available in print edition.</note>
  <note>Mode of access: World Wide Web.</note>
  <subject authority="lcsh">
    <topic>Embedded computer systems</topic>
    <topic>Testing</topic>
  </subject>
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    <titleInfo>
      <title>Computational analysis, synthesis, and design of dynamic systems ; 13</title>
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