01059nam a2200265 a 45000010008000000030009000080050017000170080041000340100017000750200015000920400028001070820018001352450119001532600043002723000029003155000152003445000016004965040053005126500041005656500057006066500041006637000030007047000028007347000031007621670415BD-KhUET20120723145045.0120723s1998    paua     b    101 0 eng    a   98022034   a0803124899  aDLCcDLCdDLCdBD-KhUET00a621.3815222100aRecombination lifetime measurements in silicon /cDinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors.  aWest Conshohocken, PA :bASTM,cc1998.  a392 p. :bill. ;c24 cm.  aPapers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997.  a"STP 1340."  aIncludes bibliographical references and indexes. 0aSemiconductorsxTestingxCongresses. 0aService life (Engineering)xForecastingxCongresses. 0aElectronic measurementsxCongresses.1 aGupta, D. C.q(Dinesh C.)1 aBacher, Fred R.,d1955-1 aHughes, William M.,d1948-