01452nam a2200325 a 4500 1670415 BD-KhUET 20120723145045.0 120723s1998 paua b 101 0 eng 98022034 0803124899 DLC DLC DLC BD-KhUET 621.38152 21 Recombination lifetime measurements in silicon / Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. West Conshohocken, PA : ASTM, c1998. 392 p. : ill. ; 24 cm. Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. "STP 1340." Includes bibliographical references and indexes. Semiconductors Testing Congresses. 6151 Service life (Engineering) Forecasting Congresses. 6152 Electronic measurements Congresses. 6153 Gupta, D. C. (Dinesh C.) 6154 Bacher, Fred R., 1955- 6155 Hughes, William M., 1948- 6156 ddc BK 6487 6487 0 0 ddc 0 0 KUETCL KUETCL GEN 2004-06-15 Asia foundation 0.00 0 621.38152 REC 3010032500 2012-07-23 00:00:00 1 2012-07-23 BK