Your search returned 7 results.

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Transmission electron microscopy of silicon VLSI circuits and structures / R.B. Marcus and T.T. Sheng. by

Material type:

Text; Format: print ; Literary form: Not fiction

Publication details: New York : Wiley, c1983

Availability: Items available for loan: Central Library, KUET (1)Call number: 621.38173 MAR.

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Scanning electron microscopy and x-ray microanalysis / author, Grahame Lawes ; editor, Arthur M. James on behalf of ACOL. by

Series:

Material type:

Text; Format: print ; Literary form: Not fiction

Publication details: Chichester [West Sussex] ; New York : Published on behalf of ACOL, Thames Polytecnic, London, by Wiley, c1987

Availability: Items available for loan: Central Library, KUET (1)Call number: 543.0812 LAW.

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Materials characterization : introduction to microscopic and spectroscopic methods / Yang Leng. by

Leng, Y. (Yang) [author.]

Edition: 2nd ed.

Material type:

Text; Format: available online remote

; Literary form: Not fiction

Publication details: Germany : Wiley-VCH, c2013

Online resources:

Wiley Online Library

Availability: Items available for reference: Central Library, KUET: Not For Loan (1)Call number: 620.11 LEN.

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Electron microscopy in heterogeneous catalysis [electronic resource] / P.L. Gai, E.D. Boyes. by

Series: Series in microscopy in materials science

Material type:

Text; Format: electronic available online remote

; Literary form: Not fiction

Publication details: Bristol ; Philadelphia : IoP, Institute of Physics Pub., c2003

Online resources:

Distributed by publisher. Purchase or institutional license may be required for access.

Availability: No items available.

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Transmission electron microscopy : a textbook for materials science / David B. Williams, C. Barry Carter. by

Edition: 2nd ed.

Material type:

Text; Format: print ; Literary form: Not fiction

Publication details: New York : Springer, c2009

Availability: Items available for reference: Central Library, KUET: Not For Loan (1)Call number: 502.825 WIL.

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Scanning transmission electron microscopy : advanced characterization methods for materials science applications / edited by Alina Bruma. by

Bruma, Alina [editor.]

Edition: 1st

Material type:

Text; Literary form: Not fiction

Publication details: London : CRC Press, c2021

Availability: Items available for loan: Central Library, KUET (1)Call number: 570.2825 SCA. Items available for reference: Central Library, KUET: Not For Loan (1)Call number: 570.2825 SCA.

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Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi. by

Dong, ZhiLi [author.]

Edition: 1st

Material type:

Text; Literary form: Not fiction

Publication details: London : CRC Press, c2022

Availability: Items available for loan: Central Library, KUET (1)Call number: 543 ZHI. Items available for reference: Central Library, KUET: Not For Loan (1)Call number: 543 ZHI.

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Your search returned 7 results.